Michael E. Stuckelberger is tenured staff scientist at DESY. Physicist by education, he holds a PhD in Materials Science from ETH Lausanne (Switzerland). During his thesis that was awarded with the EPFL prize in microtechnology, he manufactured thin-film solar cells based on amorphous silicon. During his postdoc at Arizona State University, he got first in contact with X-ray microscopy. Today, is heading a team of > 10 people developing X-ray microscopy methods for the characterization of semiconductor devices with applications from photovoltaics to power electronics. The methods for nanoscale performance mapping are successfully transferred to industry and at the core of the Materials Scanning Nanoscope beamline to be built at the new storage ring PETRA IV. He is teaching at University of Hamburg and steering international research as chair of the microscopy proposal review panels at the synchrotrons NSLS II (USA) and ESRF (France), WP leader in the EU project ReMade@ARI, and coordinator of RIANA.